Thickness, annealing and substrate effects on structural, morphological, optical and waveguiding properties of RF sputtered ZnO thin films
Crossref DOI link: https://doi.org/10.1007/s10854-017-7036-x
Published Online: 2017-04-29
Published Print: 2017-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Namoune, A.
Touam, T.
Chelouche, A.
License valid from 2017-04-29
