Reduction the leakage current through povidone-SiO2 nano-composite as a promising gate dielectric of FETs
Crossref DOI link: https://doi.org/10.1007/s10854-017-7167-0
Published Online: 2017-05-24
Published Print: 2017-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Hashemi, Adeleh
Bahari, Ali
Ghasemi, Shahram
License valid from 2017-05-24