Crossmark

Critical thickness in LaNiO3 ultrathin films: the influence of underlayer

Crossref DOI link: https://doi.org/10.1007/s10854-017-7527-9

Published Online: 2017-07-15

Published Print: 2017-11

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Bai, Yuhang

Li, Chen

Wu, Di https://orcid.org/0000-0003-3619-1411
Funding

Funding for this research was provided by:

Natural Science Foundation of China (11374139)

State Key Program for Basic Research of China (2015CB921203)
License Information

License valid from 2017-07-15