A photoelectron study of annealing induced changes to workfunction and majority carrier type in pulsed laser deposited few layer WS2 films
Crossref DOI link: https://doi.org/10.1007/s10854-018-0135-5
Published Online: 2018-10-06
Published Print: 2018-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Rathod, Urmilaben P.
Jha, Jitendra Kumar
Voevodin, Andrey A.
Shepherd, Nigel D.
Text and Data Mining valid from 2018-10-06
Article History
Received: 14 March 2018
Accepted: 29 September 2018
First Online: 6 October 2018