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Empirical expressions for the spectral dependence of the refractive index for the case of thin-film silicon and some of its common alloys

Crossref DOI link: https://doi.org/10.1007/s10854-018-0434-x

Published Online: 2018-12-03

Published Print: 2019-01

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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