Optical and electrical properties of E-Beam deposited TiO2/Si thin films
Crossref DOI link: https://doi.org/10.1007/s10854-018-9029-9
Published Online: 2018-04-04
Published Print: 2018-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Abubakar, Saleh http://orcid.org/0000-0003-1511-2219
Yilmaz, Ercan
Text and Data Mining valid from 2018-04-04
Version of Record valid from 2018-04-04
Article History
Received: 10 January 2018
Accepted: 2 April 2018
First Online: 4 April 2018