Effects of adding elements M (M = C, B, Mn, Al and Al + Co) on stability of amorphous semiconducting Fe–Si films
Crossref DOI link: https://doi.org/10.1007/s10854-018-9119-8
Published Online: 2018-04-28
Published Print: 2018-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Li, X. N. https://orcid.org/0000-0003-0891-8070
Zheng, Y. H.
Liu, Y. B.
Wang, C. Y.
Li, Z. M.
Yu, Q. X.
Dong, C.
Text and Data Mining valid from 2018-04-28
Version of Record valid from 2018-04-28
Article History
Received: 22 January 2018
Accepted: 16 April 2018
First Online: 28 April 2018