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Electrical, structural, and topographical properties of direct current (DC) sputtered bilayer molybdenum thin films

Crossref DOI link: https://doi.org/10.1007/s10854-018-9165-2

Published Online: 2018-04-27

Published Print: 2018-09

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Nwakanma, O.

Reyes, P.

Velumani, S. https://orcid.org/0000-0002-0998-7900
Funding

Funding for this research was provided by:

CEMIE Sol (P 55)
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Text and Data Mining valid from 2018-04-27
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Article History

Received: 1 December 2017

Accepted: 22 April 2018

First Online: 27 April 2018