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Temperature dependence of electrical properties in Cu0.5Ag0.5InSe2/Si heterostructure

Crossref DOI link: https://doi.org/10.1007/s10854-018-9212-z

Published Online: 2018-05-03

Published Print: 2018-07

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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