Characterization of CuInGeSe4 thin films and Al/n–Si/p–CuInGeSe4/Au heterojunction device
Crossref DOI link: https://doi.org/10.1007/s10854-018-9375-7
Published Online: 2018-05-29
Published Print: 2018-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Hameed, Talaat A.
El Radaf, I. M.
Elsayed-Ali, Hani E.
Text and Data Mining valid from 2018-05-29
Article History
Received: 16 March 2018
Accepted: 26 May 2018
First Online: 29 May 2018