Electrical properties of Au–Cu/ZnO/p-Si diode fabricated by atomic layer deposition
Crossref DOI link: https://doi.org/10.1007/s10854-018-9889-z
Published Online: 2018-09-01
Published Print: 2018-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Yıldız, D. E.
Text and Data Mining valid from 2018-09-01
Article History
Received: 25 April 2018
Accepted: 16 August 2018
First Online: 1 September 2018