Determination of optimum Er-doping level to get high transparent and low resistive Cd1 − xErxS thin films
Crossref DOI link: https://doi.org/10.1007/s10854-019-00859-3
Published Online: 2019-02-11
Published Print: 2019-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Yılmaz, S.
Polat, İ.
Tomakin, M.
Bacaksız, E.
Text and Data Mining valid from 2019-02-11
Article History
Received: 30 November 2018
Accepted: 29 January 2019
First Online: 11 February 2019