Crossmark

Effect on reliability and thermal stability of BaxSr2−xSiO4:Eu2+ phosphor film for LED applications

Crossref DOI link: https://doi.org/10.1007/s10854-019-01035-3

Published Online: 2019-03-27

Published Print: 2019-04

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Qian, Xinglu

Zheng, Changran

Shi, Mingming

Yang, Bobo

Li, Yang

Liu, Zizhuan

Zheng, Fei

Zou, Jun
Funding

Funding for this research was provided by:

Science and Technology Planning Project of Zhejiang Province (2018C01046)

Enterprise-funded Latitudinal Research Projects ((J2016-141), (J2017-171), (J2017-293), (J2017-243))
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Article History

Received: 13 December 2018

Accepted: 19 January 2019

First Online: 27 March 2019