Investigation of physical properties and surface free energy of produced ITO thin films by TVA technique
Crossref DOI link: https://doi.org/10.1007/s10854-019-01215-1
Published Online: 2019-04-02
Published Print: 2019-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Elmas, Saliha
Korkmaz, Şadan
Pat, Suat http://orcid.org/0000-0001-9301-8880
Text and Data Mining valid from 2019-04-02
Article History
Received: 22 November 2018
Accepted: 25 March 2019
First Online: 2 April 2019