Frequency effect on electrical and dielectric characteristics of In/Cu2ZnSnTe4/Si/Ag diode structure
Crossref DOI link: https://doi.org/10.1007/s10854-019-01318-9
Published Online: 2019-04-15
Published Print: 2019-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Gullu, H. H.
Bayraklı Sürücü, Ö.
Terlemezoglu, M.
Yildiz, D. E.
Parlak, M.
Text and Data Mining valid from 2019-04-15
Article History
Received: 8 February 2019
Accepted: 9 April 2019
First Online: 15 April 2019