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Investigation of dielectric relaxation and a.c. conductivity of third generation multi-component Ge10−xSe60Te30Sbx (0 ≤ x ≤ 6) chalcogenide glasses

Crossref DOI link: https://doi.org/10.1007/s10854-019-01763-6

Published Online: 2019-07-01

Published Print: 2019-07

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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