The effect of stress state on AlN thin films and AlN/Finemet magnetoelectric composite device
Crossref DOI link: https://doi.org/10.1007/s10854-019-01772-5
Published Online: 2019-07-11
Published Print: 2019-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Yin, Liping
Hu, Wenlong
Wu, Ming
Shi, Jiaxing
Zhu, Jie
Text and Data Mining valid from 2019-07-11
Version of Record valid from 2019-07-11
Article History
Received: 24 April 2019
Accepted: 27 June 2019
First Online: 11 July 2019