Impurity induced dielectric relaxor behavior in Zn doped LaFeO3
Crossref DOI link: https://doi.org/10.1007/s10854-019-02281-1
Published Online: 2019-09-30
Published Print: 2019-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Manzoor, Samiya
Husain, Shahid http://orcid.org/0000-0001-9145-0020
Somvanshi, Anand
Fatema, Mehroosh
Zarrin, Naima
Text and Data Mining valid from 2019-09-30
Version of Record valid from 2019-09-30
Article History
Received: 1 July 2019
Accepted: 24 September 2019
First Online: 30 September 2019