The role of interface traps, series resistance and (Ni-doped PVA) interlayer effects on electrical characteristics in Al/p-Si (MS) structures
Crossref DOI link: https://doi.org/10.1007/s10854-019-02352-3
Published Online: 2019-10-15
Published Print: 2019-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Demirezen, Selçuk
Funding for this research was provided by:
Amasya Üniversitesi (FMB-BAP17-0292)
Text and Data Mining valid from 2019-10-15
Version of Record valid from 2019-10-15
Article History
Received: 12 June 2019
Accepted: 10 October 2019
First Online: 15 October 2019