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Depth profile crystal orientation determination of Cu(In1−xGax)Se2 thin films by GIXRD method applying skin depth theory

Crossref DOI link: https://doi.org/10.1007/s10854-019-02390-x

Published Online: 2019-10-23

Published Print: 2019-11

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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