Investigation of the effect of different Bi2O3–x:PVA (x = Sm, Sn, Mo) thin insulator interface-layer materials on diode parameters
Crossref DOI link: https://doi.org/10.1007/s10854-020-03343-5
Published Online: 2020-04-06
Published Print: 2020-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Badali, Yusuf
Azizian-Kalandaragh, Yashar
Uslu, İbrahim
Altindal, Şemsettin
Text and Data Mining valid from 2020-04-06
Version of Record valid from 2020-04-06
Article History
Received: 6 February 2020
Accepted: 29 March 2020
First Online: 6 April 2020