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Frequency effect on electrical and dielectric characteristics of HfO2-interlayered Si-based Schottky barrier diode

Crossref DOI link: https://doi.org/10.1007/s10854-020-03479-4

Published Online: 2020-05-04

Published Print: 2020-06

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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