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Point defects behavior analysis in thin films and massif SnO2 by AES spectroscopy and photoluminescence

Published Online: 2020-05-15

Published Print: 2020-07

Authors

Ghaffor, Djamel

Lounis, Zakia https://orcid.org/0000-0003-1913-4001
Zegadi, Chawki

Mahfoud, Abdelkrim

Derri, Amira

Hadj-Kaddour, Amel

Bouslama, M’hamed
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Text and Data Mining valid from 2020-05-15

Version of Record valid from 2020-05-15
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Article History

Received: 12 December 2019

Accepted: 7 May 2020

First Online: 15 May 2020

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