Material and Si-based diode analyses of sputtered ZnTe thin films
Crossref DOI link: https://doi.org/10.1007/s10854-020-03688-x
Published Online: 2020-05-29
Published Print: 2020-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Gullu, H. H. http://orcid.org/0000-0001-8541-5309
Surucu, O. Bayraklı
Isik, M.
Terlemezoglu, M.
Parlak, M.
Text and Data Mining valid from 2020-05-29
Version of Record valid from 2020-05-29
Article History
Received: 30 March 2020
Accepted: 25 May 2020
First Online: 29 May 2020