Processing and characterization of co silicide ohmic contacts to 4H–SiC
Crossref DOI link: https://doi.org/10.1007/s10854-020-04178-w
Published Online: 2020-08-14
Published Print: 2020-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kim, Taehong
Kim, Junghun
Kim, Kwangsoo http://orcid.org/0000-0001-8243-3472
Text and Data Mining valid from 2020-08-14
Version of Record valid from 2020-08-14
Article History
Received: 1 June 2020
Accepted: 5 August 2020
First Online: 14 August 2020
Compliance with ethical standards
:
: The authors declare that they have no conflict of interest.