Crossmark

Ionizing radiation effects on Au/TiO2/n-Si metal–insulator-semiconductor (MIS) structure

Crossref DOI link: https://doi.org/10.1007/s10854-020-04508-y

Published Online: 2020-09-23

Published Print: 2020-11

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Ertugrul-Uyar, R.

Buyukbas-Ulusan, A.

Tataroglu, A. https://orcid.org/0000-0003-2074-574X
License Information

Text and Data Mining valid from 2020-09-23

Version of Record valid from 2020-09-23
More Information

Article History

Received: 5 August 2020

Accepted: 16 September 2020

First Online: 23 September 2020