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Investigation of FePt electrode induced influence on resistive switching characteristics of SiO2-based RRAM

Published Online: 2020-09-25

Published Print: 2020-11

Authors

Sun, C.

Lu, S. M.

Jin, F.

Mo, W. Q.

Song, J. L.

Dong, K. F. https://orcid.org/0000-0001-8999-562X
Funding

Funding for this research was provided by:

the National Natural Science Foundation of China (No.51501168, 41574175, 41204083)

the Fundamental Research Funds for the Central Universities, China University of Geosciences (No.CUG150632 and, CUGL160414)
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Text and Data Mining valid from 2020-09-25

Version of Record valid from 2020-09-25
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Article History

Received: 30 July 2020

Accepted: 18 September 2020

First Online: 25 September 2020

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