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Frequency and voltage-dependent electrical parameters, interface traps, and series resistance profile of Au/(NiS:PVP)/n-Si structures

Crossref DOI link: https://doi.org/10.1007/s10854-021-05947-x

Published Online: 2021-05-06

Published Print: 2021-05

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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