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Structural and electrical properties of epitaxial SnO2: Sb films deposited on 6 H-SiC by MOCVD

Crossref DOI link: https://doi.org/10.1007/s10854-021-06701-z

Published Online: 2021-08-02

Published Print: 2021-08

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Luan, Caina https://orcid.org/0000-0002-0644-5356
Zhu, Zhen
Funding

Funding for this research was provided by:

National Natural Science Foundation of China (50872073)
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Text and Data Mining valid from 2021-08-01

Version of Record valid from 2021-08-01
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Article History

Received: 29 March 2021

Accepted: 24 July 2021

First Online: 2 August 2021