Crossmark

Effect of illumination intensity on the electrical characteristics of Au//SiO2/n-type Si structures with GO and P3C4MT interface layer

Published Online: 2022-08-02

Published Print: 2022-08

Authors

Seymen, Halil

Berk, Niyazi

Orak, İkram

Karataş, Şükrü https://orcid.org/0000-0003-1668-7866
License Information

Text and Data Mining valid from 2022-08-01

Version of Record valid from 2022-08-01
More Information

Article History

Received: 13 June 2022

Accepted: 19 July 2022

First Online: 2 August 2022

Declarations

:

: The authors declare that there is no conflict of interest.

: All the authors declare their consent to participate in this research article.

Document is current