Voids formation and Cu3Sn growth mechanisms in Cu/Cu3Sn/Cu6Sn5 system under air in Cu/SnAg joints for microelectronic packaging
Crossref DOI link: https://doi.org/10.1007/s10854-022-09305-3
Published Online: 2022-10-29
Published Print: 2022-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Barik, El Mostafa https://orcid.org/0000-0002-5524-3304
Gillot, Charlotte
Hodaj, Fiqiri
Text and Data Mining valid from 2022-10-29
Version of Record valid from 2022-10-29
Article History
Received: 2 July 2022
Accepted: 10 October 2022
First Online: 29 October 2022
Declarations
:
: The authors have no relevant financial or non-financial interests to disclose.