Optical characterizations of lightly doped (PbS)1−x Znx thin films influenced by film thickness and annealing temperature for applications in highly intensive radiation systems
Crossref DOI link: https://doi.org/10.1007/s10854-023-11274-0
Published Online: 2023-10-03
Published Print: 2023-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Shokr, E. Kh.
Mohamed, W. S.
Adam, A. G. http://orcid.org/0009-0000-8778-0561
Ali, H. M.
Funding for this research was provided by:
Sohag University
Text and Data Mining valid from 2023-10-01
Version of Record valid from 2023-10-03
Article History
Received: 12 June 2023
Accepted: 6 September 2023
First Online: 3 October 2023