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Characterization of thin films Al/p-Cu2ZnSnS4 (CZTS)/Mo Schottky diode: the effect of CZTS thin film thickness

Published Online: 2023-12-22

Published Print: 2024-01

Authors

Bousselmi, G. https://orcid.org/0000-0002-0389-1254
Hannachi, A.

Khemiri, N.

Kanzari, M.
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Text and Data Mining valid from 2023-12-22

Version of Record valid from 2023-12-22
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Article History

Received: 16 August 2023

Accepted: 31 October 2023

First Online: 22 December 2023

Declarations

:

: The authors declare that they have no conflict of interest.

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