Influence of ionizing radiation on admittance measurements of Au/TiO2/n-Si (MIS) capacitor
Crossref DOI link: https://doi.org/10.1007/s10854-024-12189-0
Published Online: 2024-02-26
Published Print: 2024-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
İzdeş, Mehmet
Ertuğrul Uyar, Raziye http://orcid.org/0000-0001-5678-1051
Tataroğlu, Adem
Funding for this research was provided by:
Gazi University
Text and Data Mining valid from 2024-02-01
Version of Record valid from 2024-02-26
Article History
Received: 5 December 2023
Accepted: 13 February 2024
First Online: 26 February 2024
Declarations
:
: There are no conflicts to declare.