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Effect of electro-thermal diffusion induced deterioration on the failure mechanism of Pd-Au-coated Cu wires

Published Online: 2024-11-04

Published Print: 2024-11

Authors

Wu, Bo-Ding

Hsu, Chung-Kai

Huang, Bo-Chin

Hung, Fei-Yi https://orcid.org/0000-0001-5432-0980
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Text and Data Mining valid from 2024-11-01

Version of Record valid from 2024-11-01
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Article History

Received: 18 June 2024

Accepted: 15 October 2024

First Online: 4 November 2024

Declarations

:

: The authors declare no conflict of interest.

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