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Microstructure and Raman spectra analysis of [(Zn0.8Mg0.2)1-xNix]2SiO4 microwave dielectric ceramics featuring low relative permittivity and low dielectric loss

Crossref DOI link: https://doi.org/10.1007/s10854-025-14468-w

Published Online: 2025-03-05

Published Print: 2025-03

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Chen, Yuan-Bin https://orcid.org/0000-0003-1652-7133
Tang, Ling
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Text and Data Mining valid from 2025-03-01

Version of Record valid from 2025-03-01
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Article History

Received: 12 November 2024

Accepted: 17 February 2025

First Online: 5 March 2025

Declarations

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: The authors declare that they have no known competing financial interests or personal relationships that could have appeared to influence the work reported in this paper.

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