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Charge carrier transport in silicon heterojunctions with a 20 nm thick titanium oxide layer grown by atomic layer deposition

Crossref DOI link: https://doi.org/10.1007/s10854-025-14909-6

Published Online: 2025-05-20

Published Print: 2025-05

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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