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Role of thickness on the optical and electrical properties of physically evaporated TiO2 thin films and silicon-based n-TiO2/p-Si heterojunction (HJ) configurations

Crossref DOI link: https://doi.org/10.1007/s10854-025-15153-8

Published Online: 2025-06-17

Published Print: 2025-06

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Özmenteş, Reşit https://orcid.org/0000-0002-5893-0660
Funding

Funding for this research was provided by:

Bitlis Eren University
License Information

Text and Data Mining valid from 2025-06-01

Version of Record valid from 2025-06-17
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Article History

Received: 14 February 2025

Accepted: 7 June 2025

First Online: 17 June 2025

Declarations

:

: The author declares that there is no conflict of interest in the current article.

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