Crossmark

Gamma irradiation-induced trap behavior in AlGaN-based UV-C LEDs causing accelerated failure under electrical stress

Published Online: 2025-10-03

Published Print: 2025-10

Authors

Su, Mengwei https://orcid.org/0000-0001-6576-9433
Liu, Hongxia

Zhang, Hao

Liu, Chang
Funding

Funding for this research was provided by:

National Natural Science Foundation of China (U2241221)

Opening Project of Science and Technology on Reliability Physics and Application Technology of Electronic Component Laboratory (ZHD202301)
License Information

Text and Data Mining valid from 2025-10-01

Version of Record valid from 2025-10-01
More Information

Article History

Received: 23 July 2025

Accepted: 17 September 2025

First Online: 3 October 2025

Declarations

:

: The authors have no relevant financial or non-financial interests to disclose.

Document is current