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Effect of gallium ratio on the electrical characteristics and stability of GZTO thin-film transistors: a trap state analysis

Crossref DOI link: https://doi.org/10.1007/s10854-025-16558-1

Published Online: 2026-01-09

Published Print: 2026-01

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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