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Comparative optoelectronic evaluation of CuS-based thin-film p–n junction photodiodes on ATO, FTO, and ZnO substrates fabricated via spray pyrolysis

Crossref DOI link: https://doi.org/10.1007/s10854-026-16901-0

Published Online: 2026-04-07

Published Print: 2026-04

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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