Effect of argon and oxygen atmospheres on the growth and characteristics of NiO thin films deposited by RF sputtering technique
Crossref DOI link: https://doi.org/10.1007/s10854-026-17343-4
Published Online: 2026-04-26
Published Print: 2026-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Srinivasa, N. V.
Choi, W. K.
Angadi, Basavaraj
Text and Data Mining valid from 2026-04-01
Version of Record valid from 2026-04-01
Article History
Received: 25 December 2025
Accepted: 20 April 2026
First Online: 26 April 2026
Declarations
:
: The authors declare no competing interests.