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High-temperature Eu diffusion in KEF-80 silicon: XRD, Raman, SEM/EDS and impedance evidence of near-surface structural heterogeneity and apparent interfacial polarization

Crossref DOI link: https://doi.org/10.1007/s10854-026-17750-7

Published Online: 2026-06-17

Published Print: 2026-06

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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