Distinctive Features of the Temperature Sensitivity of a Transistor Structure in a Bipolar Mode of Measurement
Crossref DOI link: https://doi.org/10.1007/s10891-016-1404-x
Published Online: 2016-04-11
Published Print: 2016-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Karimov, A. V.
Dzhuraev, D. P.
Kuliev, Sh. M.
Turaev, A. A.
Text and Data Mining valid from 2016-03-01