X-ray Intensity Measurements in 2.8 kJ Plasma Focus Device Operated with Argon Using a Five Channel Diode Spectrometer
Crossref DOI link: https://doi.org/10.1007/s10894-014-9771-9
Published Online: 2014-09-25
Published Print: 2015-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Al-Hawat, Sh.
Akel, M.
Shaaban, S.
Text and Data Mining valid from 2014-09-25