The Helium Field Effect Transistor (II): Gated Transport of Surface-State Electrons Through Micro-constrictions
Crossref DOI link: https://doi.org/10.1007/s10909-016-1641-6
Published Online: 2016-06-29
Published Print: 2016-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Shaban, F.
Ashari, M.
Lorenz, T.
Rau, R.
Scheer, E.
Kono, K.
Rees, D. G.
Leiderer, P.
License valid from 2016-06-29