Comparison of Critical Current Scaling Behaviors in $$\hbox {MgB}_{2}$$ MgB 2 /SiC/Si Thin Films
Crossref DOI link: https://doi.org/10.1007/s10909-017-1777-z
Published Online: 2017-04-06
Published Print: 2017-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Nishida, Akihiko https://orcid.org/0000-0002-4894-0769
Taka, Chihiro
Chromik, Stefan
Durny, Rudolf
License valid from 2017-04-06