Parallel Critical Field in Thin Niobium Films: Comparison to Theory
Crossref DOI link: https://doi.org/10.1007/s10909-017-1792-0
Published Online: 2017-07-06
Published Print: 2017-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Broussard, P. R. https://orcid.org/0000-0001-8464-4054
License valid from 2017-07-06