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SiGe Integrated Circuit Developments for SQUID/TES Readout

Crossref DOI link: https://doi.org/10.1007/s10909-018-1886-3

Published Online: 2018-03-08

Published Print: 2018-11

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Prêle, D. https://orcid.org/0000-0002-6680-1930
Voisin, F.

Beillimaz, C.

Chen, S.

Piat, M.

Goldwurm, A.

Laurent, P.
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Text and Data Mining valid from 2018-03-08
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Article History

Received: 4 September 2017

Accepted: 27 February 2018

First Online: 8 March 2018