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CUTE: A Low Background Facility for Testing Cryogenic Dark Matter Detectors

Crossref DOI link: https://doi.org/10.1007/s10909-018-2014-0

Published Online: 2018-07-03

Published Print: 2018-12

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Camus, Ph. https://orcid.org/0000-0002-5530-3477
Cazes, A.

Dastgheibi-Fard, A.

Dering, K.

Gerbier, G.

Rau, W.

Scorza, S.

Zhang, X.
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Text and Data Mining valid from 2018-07-03
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Article History

Received: 23 September 2017

Accepted: 25 June 2018

First Online: 3 July 2018